Accel-RF Instruments Corporation is the worldwide leader in integrated RF accelerated life-test/burn-in test systems for compound semiconductor devices which are used in the implementation of broadband wireless infrastructures and networks. Our fully automated turnkey systems and innovative desktop Test Characterization Platforms determine RF and DC performance degradation with aging to predict life expectancy. With a legacy that goes back to 1988, Accel-RF develops the equipment you need to reduce product development costs, ensure exceptional reliability, and increase the total sales income opportunity. Leveraging off of our expertise in RF device testing, Accel-RF has also developed a portfolio of compact desktop test fixture platforms that allows users to efficiently (and with a high degree of precision) perform numerous bench top test scenarios including reliability and screening to characterization and acceptance testing. The Accel-RF Self-Contained RF Characterization Platform is a standalone solution for bench top RF and Thermal Characterization. It allows for easy measurement of critical performance characteristics used for intrinsic reliability studies, performance degradation studies, or for parameter variation analysis while saving significant costs.