Four Dimensions manufactures advanced semiconductor probing systems since 1978. Our Four Point Probe and CVmap systems are found in hundreds of fabs and research institutions around the world. Products: We provide four point probes with an extended measurement range or sophisticated probing for compound semiconductors. Our latest innovation is a Modified four point probe for measuring PN junction leakage and sheet resistivity in the same probing step meeting the requirements for ultra shallow junction probing. Four-Point Probe: - extended measurement range - high compliance voltage (enables measuring high resistivity thicker sample) - partial wafer mapping - very user-friendly software We offer the widest range of Mercury probe geometries and special capacitance measurement electronics. This permits our systems to probe and characterize a wide range of materials, including semi-conductors, oxides, dielectrics, SOI ( silicon on insulator ), and films on conducting or insulating substrates. CVmap: - safe design (contact from below) - special designed spill proof mercury reservoir - excellent contact area repeatability - more than one con contact area on the front side - refreshing mercury 9refreshes mercury before each contact) - easy to replace parts and mercury - compact design (small footprint) - only need to change mercury twice a year - offer the widest range of contact areas and probe head configurations - no frequent calibration needed - very user-friendly software